INNOVALIA METROLOGY WILL BE AT 33BIEMH

At BIEMH, Innovalia Metrology will present its advanced industrial metrology solutions, with a clear focus on integrating dimensional control directly into production processes.

Among the technologies on display will be CyberSpark, the new CMM designed for in-line dimensional inspection. This solution allows quality control to be carried out at the machine, reducing waiting times, eliminating unnecessary travel and minimising bottlenecks between production and the metrology room. Thanks to its compact, robust and intuitive design, CyberSpark offers high precision even in demanding industrial environments, facilitating the incorporation of metrological control into the daily manufacturing flow.

With this proposal, Innovalia Metrology reinforces its commitment to a more efficient, connected industry focused on real-time quality control.